Advanced Microphone Measurements Part 2
Listen’s Support Manager, Steve Tatarunis, discusses some of the more advanced aspects of microphone measurements. This is an expansion of material covered in the Basic Microphone Testing webinar, and part two of the full advanced microphone measurements seminar. Advanced Microphone Test part 1 shows microphone measurements like polar plotting, open loop, active/passive noise rejection, and more. This seminar is of interest to anyone testing microphone characteristics, both in an R&D and production line environment. The tests featured in this seminar can be used both at component level, whether selecting microphones for devices or component QC, or these tests can be performed on finished products like smartphones, smart speakers, and more.
Seminar topics include:
More advanced aspects of microphone testing including:
- Phase
- Open loop microphone testing for voice activated devices such as smart speakers, automotive audio, etc.
- Intermodulation distortion
- Advanced hardware and test configurations for measuring microphone arrays
- Beamforming with broadside and endfire arrays
- Measuring MEMS devices frequency, sensitivity and power supply rejection (PSR) performance
Presenters: Steve Tatarunis
Duration: 40 Mins
Advanced microphone measurements resources
SoundCheck comes with many pre-written sequences including the sequences demonstrated in this seminar including the microphone test sequences for measuring microphone self noise, microphone substitution, frequency response and sensitivity, and open loop. Additionally, we offer the sequences featured in this seminar measuring digital MEMS microphones and microphone intermodulation distortion in our sequence library for download. Along with the sequences featured in this seminar, our sequence library is full of additional pre-written sequences for basic microphone measurement.
More about advanced microphone measurements
Check out our main page on Microphones, which includes links to test sequences, relevant products and more.