Steve Temme discusses the importance of detecting manufacturing-induced defects such as Rub & Buzz and Loose Particles during end-of-line testing, and explains the various algorithms that are used. He compares conventional and perceptual metrics for the measurement of Rub & Buzz, including Listen’s new enhanced Perceptual Rub & Buzz algorithm, and discusses why it can be beneficial to use both conventional and perceptual measurements in tandem.

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