Posts

The Correlation Between Distortion Audibility and Listener Preference in Headphones

It is well-known that the frequency response of loudspeakers and headphones has a dramatic impact on sound quality and listener preference, but what role does distortion have on perceived sound quality? To answer this question, five popular headphones with varying degrees of distortion were selected and equalized to the same frequency response. Trained listeners compared them subjectively using music as the test signal, and the distortion of each headphone was measured objectively using a well-known commercial audio test system. The correlation between subjective listener preference and objective distortion measurement is discussed.

Authors: Steve Temme, Sean E. Olive*, Steve Tatarunis, Todd Welti*, and Elisabeth McMullin*            *Harman International
Presented at the 137th AES Conference, Los Angeles 2014

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Advances in Impedance Measurement of Loudspeakers and Headphones

Impedance measurement is often the sole electrical measurement in a battery of QC tests on loudspeakers and headphones. Two test methods are commonly used, single channel and dual channel. Dual Channel measurement offers greater accuracy as both the voltage across the speaker (or headphone) and the reference resistor are measured to calculate the impedance. Single Channel measurement methods are more commonly used on the production line because they only require one channel of a stereo soundcard, which leaves the other free for simultaneous acoustic
tests. They are less accurate, however, due to the test methods making assumptions of constant voltage or constant current. In this paper we discuss a novel electrical circuit that offers similar impedance measurement accuracy compared to complex dual channel measurement methods but using just one channel. This is expected to become popular for high throughput production line measurements where only one channel is available as the second channel of the typical soundcard is being used for simultaneous acoustic tests.

Authors: Steve Temme and Tony Scott
Presented at the 135th AES Conference, New York 2013

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