During the loudspeaker manufacturing process, particles may become trapped inside the loudspeaker, resulting in a distinctive defect that is easily heard but difficult to measure. To give a clearer view of the problem, Time-Frequency maps are shown for some defective loudspeakers. Based on this analysis, a reliable testing procedure using a swept-sine stimulus, high-pass filter, and RMS-envelope analysis is presented. Further possible enhancements and applications of the method are listed.
Authors: Pascal Brunet, Evan Chakroff and Steve Temme
Presented at the 115th AES Convention, New York, 2003